Alfonso Farina, a well-known Italian engineer that pioneered new technology in radar systems and signal processing, authored more than 1000 papers, noted for his work to bridge the gap between industry and academy, and fellow with the IEEE and IET, talks with Pat Hindle, Media Director at Microwave Journal, about his passion for engineering, close connection to academia, invention of Track While Scan Radar, advice for young engineers and more. Here is a link to the text version of the conversation.
Learn About Sivers Semiconductor's 5G Project: Interview with CEO, Anders Storm
Frequency Matters, Jan 29: Radar/Antenna Issue, Interview with Sivers CEO and Industry News/Events
Market Overview and Component Needs for 5G Sub 6 GHz versus mmWave - Part II
Frequency Matters, Jan 15: Jan Radar/Antenna issue, EuMW & CES Events
Adhesive-peeled Flexible Sensors with Dr. Amr Haj-Omar, Tektronix
Wireless Power Over Distance Technology and Trends with Powercast
Discussion with Glen Clark, CVP R&D at Cadence, About RF Products
Commercial and Military Space Market Trends with ADI's A&D Director Sean Darcy
Frequency Matters, Dec 14: Special Holiday Gifts for the RF Engineer
Frequency Matters Dec 4: Issue cover/features, EuMW 2020 & News
RFMW Company Update: Interview With Joel Levine, President/CEO
Frequency Matters, Nov 20: Issue Products, News, RFMW Interview
Evolution of the RF Front End: A Discussion with Qualcomm SVP/GM Christian Block
Frequency Matters, Nov 11: 5G & IoT Issue, News, Virtual Events
Celebrating the 43 Year Career of Steve Pook at BAE
Mobile Device Design Challenges for 5G, Part I
Interview with Pasternack's Steven Pong: Passive Device Technology
Frequency Matters, Oct 30: Upcoming Issues, Interview w/Pasternack, News/Events
The Future of Technology - Interview with NI's Scott Rust
Interview on Space Market with ADI's Sean Darcy
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